Published Results for Scratch & Dig Measurement
EVALUATING MODI FOR OPTICAL QUALITY CONTROL
To evaluate performance, the MODI platform was tested against a qualified optical defect standard containing scratches and digs of known classifications and dimensions. The following results demonstrate the system's ability to automatically detect, measure, and classify defects using objective image analysis workflows. By comparing measured values against certified reference features, these tests provide insight into the accuracy, repeatability, and practical applicability of automated defect characterization for optical quality control.
Target Information:
Micros MOTP-ISO Scratch-Dig Panel, ISO 10110-7 Standard
Scratch widths ranging from 5um to 120um
Dig diameters ranging from 50um to 1mm
Figure 1—Image of micros target and overlayed locations of 5um scratch & 50um dig targets on stitched imagery.
Figure 2—Dig classification of 5 (50um) measured at 60.3um in the GeoPulse Analysis Software.
Figure 3—Scratch classification of 5 (5um) measured at 5.8um width in the GeoPulse Analysis software.
Other detections on a variety of optics including sleeks and more complex digs:
